The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Jun. 09, 2022
Applicant:

Cubicpv Inc., Dallas, TX (US);

Inventors:

Michael D. Irwin, Heath, TX (US);

Jerome Lovelace, McKinney, TX (US);

Kamil Mielczarek, Rowlett, TX (US);

Assignee:

CubicPV Inc., Bedford, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02S 99/00 (2014.01); H02S 50/15 (2014.01); H02S 50/10 (2014.01);
U.S. Cl.
CPC ...
H02S 99/00 (2013.01); H02S 50/10 (2014.12); H02S 50/15 (2014.12);
Abstract

The performance of photosensitive devices over time may be tested by configuring a photosensitive device test system that includes a light source plate that exposes photosensitive devices within a container to a specified light intensity. The light intensity may be adjusted by a programmable power source according to one or more thresholds. A test may last for a set duration with performance measurements being taken at predetermined intervals throughout the duration. Feedback from the photosensitive device test system may be recorded to determine whether to increase light intensity, to stop testing, to continue testing, and whether one or more environmental conditions should be altered. Measurements may be sent to a client for analysis and display to a user.


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