The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

May. 27, 2022
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Tianqing Liao, Mountain View, CA (US);

Sima Didari, San Jose, CA (US);

Harikrishnan Rajagopal, Santa Clara, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/06 (2006.01); G05B 23/02 (2006.01); G06F 16/28 (2019.01); H01J 37/317 (2006.01); H01L 21/67 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
H01L 21/67213 (2013.01); G05B 23/024 (2013.01); G05B 23/0254 (2013.01); G05B 23/0283 (2013.01); H01J 37/3171 (2013.01); G06F 16/285 (2019.01); G06N 20/00 (2019.01);
Abstract

A method includes determining, based on sensor data, that one or more components of substrate processing equipment are within a pre-failure window that is after a normal operation window. Corresponding data points in the normal operation window are substantially stable along a first health index value. The corresponding data points in the pre-failure window increase from the first health index value to a peak at a second health index value. Responsive to the determining that the one or more components are within the pre-failure window, the method further includes causing performance of a corrective action associated with the one or more components of the substrate processing equipment.


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