The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Mar. 06, 2020
Kingtiger Technology (Canada) Inc., Markham, CA;
Bosco Chun Sang Lai, Markham, CA;
Sunny Lai-Ming Chang, Markham, CA;
Lawrence Wai Cheung Ho, Mississauga, CA;
Eric Sin Kwok Chiu, Mississauga, CA;
Simon Shu Man Choi, Markham, CA;
Arthur Yu Kuen Lam, Toronto, CA;
KINGTIGER TECHNOLOGY (CANADA) INC., Markham, CA;
Abstract
Systems and methods are provided for testing a Device Under Test (DUT) in its working environment. A control computer is coupled to an air compressor and generates a temperature control signal that is provided to the air compressor to generate an amount of hot air or cold air to set the temperature of the DUT's working environment to a desired test temperature. The control computer also generates at least one test signal that is sent to a hardware test element for testing at least one memory component of the DUT at the desired test temperature and obtaining test results. The control computer analyzes the test results to determine a parameter adjustment for the at least one memory element so that it operates in a stable manner at the test temperature.