The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Dec. 19, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Sehwan Park, Yongin-si, KR;

Jinyoung Kim, Seoul, KR;

Youngdeok Seo, Seoul, KR;

Dongmin Shin, Seoul, KR;

Joonsuc Jang, Hwaseong-si, KR;

Sungmin Joe, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/42 (2006.01); G11C 29/44 (2006.01); G11C 29/18 (2006.01); G11C 16/10 (2006.01); G11C 29/12 (2006.01); G11C 16/26 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G11C 16/102 (2013.01); G11C 16/26 (2013.01); G11C 29/12015 (2013.01); G11C 29/18 (2013.01); G11C 29/4401 (2013.01); G11C 2029/1202 (2013.01); G11C 2029/1204 (2013.01); G11C 2029/1802 (2013.01);
Abstract

A storage device includes a nonvolatile memory device and a memory controller to control the nonvolatile memory device. The nonvolatile memory device includes a memory cell array. The memory cell array includes a normal cell region, a parity cell region and a redundancy cell region. First bit-lines are connected to the normal cell region and the parity cell region and second bit-lines are connected to the redundancy cell region. The memory controller includes an error correction code (ECC) engine to generate parity data. The memory controller stores user data in the normal cell region, controls the nonvolatile memory device to perform a column repair on first defective bit-lines among the first bit-lines, assigns additional column addresses to the first defective bit-lines and the second bit-lines and stores at least a portion of the parity data in a region corresponding to the additionally assigned column addresses.


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