The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Sep. 09, 2019
Applicant:

Sony Semiconductor Solutions Corporation, Kanagawa, JP;

Inventors:

Hirotaka Ishikawa, Kanagawa, JP;

Kanji Ogawa, Kanagawa, JP;

Toshiyuki Yamauchi, Tokyo, JP;

Akihiro Muto, Kanagawa, JP;

Tomoki Oooka, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06N 3/08 (2023.01); G06V 10/25 (2022.01); G06V 20/58 (2022.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06N 3/08 (2013.01); G06V 10/25 (2022.01); G06T 2207/10024 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20132 (2013.01); G06V 20/58 (2022.01);
Abstract

A large number of highly accurate learning images are generated without bias at reduced costs. An information processing method for causing a processor to execute: automatically cropping a region including an object from a material image to generate an automatically cropped image; and performing learning related to detection of the object on the basis of the automatically cropped image, wherein the generating of the automatically cropped image further includes generating the automatically cropped image using an automatic cropping machine that is generated by learning on the basis of manually cropped images obtained by manually cropping a region including the object from the material image.


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