The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Oct. 18, 2019
Applicant:

Nhn Cloud Corporation, Gyeonggi-do, KR;

Inventors:

Hyeon-gi Kim, Gyeonggi-do, KR;

Rokkyu Lee, Gyeonggi-do, KR;

Assignee:

NHN CLOUD CORPORATION, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 5/20 (2006.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06T 5/20 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A system and a method for detecting image forgery through a convolutional neural network are capable of detecting image manipulation of compressed and/or color images. The system comprises a manipulated feature pre-processing unit applying an input image to a high-pass filter to enhance features due to image forgery; a manipulated feature extraction unit extracting image manipulated feature information from the image with the enhanced features through a pre-trained convolutional neural network; a feature refining unit refining the extracted image manipulated feature information; and a manipulation classifying unit determining the image forgery based on the image manipulated feature information refined by the feature refining unit.


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