The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Jul. 13, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kazuki Sekiguchi, Tokyo, JP;

Fumihiko Terui, Tokyo, JP;

Pinaki Chandra Dey, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2023.01); G06F 11/34 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06F 11/34 (2013.01); G06N 20/00 (2019.01);
Abstract

A computer-implemented method for detecting and monitoring bias in an application includes index training data and obtaining a plurality of correlation values of one or more features in the indexed training data with a target variable. For each of the one or more features, a first value and a favorable result and a second value along with the unfavorable result is calculated. An absolute value of a difference between the calculated first value and the calculated second value is calculated. A total sum of the calculated absolute value of the plurality of correlation values of the one of the one or more features is calculated.


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