The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Jan. 06, 2023
Applicant:
Nasdaq, Inc., New York, NY (US);
Inventors:
Douglas Hamilton, Boston, MA (US);
Michael O'Rourke, Southbury, CT (US);
Xuyang Lin, Cambridge, MA (US);
Hyunsoo Jeong, Boston, MA (US);
William Dague, New York, NY (US);
Tudor Morosan, Toronto, CA;
Assignee:
NASDAQ, INC., New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06N 5/022 (2023.01); G06N 20/00 (2019.01); G06F 16/25 (2019.01); G06F 18/214 (2023.01); G06F 18/2113 (2023.01); G06N 5/01 (2023.01);
U.S. Cl.
CPC ...
G06N 5/022 (2013.01); G06F 16/254 (2019.01); G06F 18/2113 (2023.01); G06F 18/2148 (2023.01); G06N 5/01 (2023.01); G06N 20/00 (2019.01);
Abstract
A computer system is provided that is programmed to select feature sets from a large number of features. Features for a set are selected based on metagradient information returned from a machine learning process that has been performed on an earlier selected feature set. The process can iterate until a selected feature set converges or otherwise meets or exceeds a given threshold.