The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

May. 28, 2021
Applicant:

Paypal, Inc., San Jose, CA (US);

Inventors:

Gaoyuan Wang, San Jose, CA (US);

Jie Huang, Shanghai, CN;

Zelin Yan, Shanghai, CN;

Fuyuan Kang, Shanghai, CN;

Assignee:

PayPal, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/28 (2019.01); G06F 16/25 (2019.01); G06F 11/34 (2006.01); G06F 16/215 (2019.01);
U.S. Cl.
CPC ...
G06F 16/285 (2019.01); G06F 11/3442 (2013.01); G06F 16/215 (2019.01); G06F 16/252 (2019.01); G06F 16/258 (2019.01);
Abstract

Techniques are discussed for preparing and executing scanning plans for particular types of information, including personally identifiable information. A user indicates one or more datastores to be scanned for the particular type of information. A scanner determines scan objectives for the scanning plan and classifiers for use in scans conducted according to the scanning plan. The scanner estimates scan performance metrics and scan quality metrics. The scanner presents estimated results for the scanning plan based on the selected classifiers, scan objectives, estimate scan performance metrics, and estimated scan quality metrics. The user can modify the set of scan objectives or select between alternative sets of scan objectives. The scanning plan may be performed iteratively and the results of previous scan may be used to adjust classifiers or scan objectives to be used in subsequent scans.


Find Patent Forward Citations

Loading…