The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Jul. 23, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Masato Yamamura, Yamanashi, JP;

Hitoshi Hirota, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); G06F 16/2457 (2019.01); G06F 16/248 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24575 (2019.01); G06F 16/248 (2019.01);
Abstract

An inquiry system is provided in which an inquiry unit of a user of a machine and/or a device makes inquiries related to the machine and/or the device to inquiry a plurality of center systems of suppliers, and includes: a relay device which connects the inquiry unit and the inquiry center systems; and a storage unit which stores first and second identification information related to the machine and/or the device, the inquiry unit includes: an acquisition unit which acquires the first identification information; and a first communication unit which transmits the first identification information acquired to the relay device, the relay device includes: a second communication unit which communicates between the inquiry unit and the inquiry center systems; and a selection unit which selects, based on the first and second identification information, the inquiry center system and the second communication unit connects the inquiry unit and the inquiry center system.


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