The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
May. 27, 2021
Inspur Suzhou Intelligent Technology Co., Ltd., Jiangsu, CN;
Jingdong Zhang, Jiangsu, CN;
Jiangwei Wang, Jiangsu, CN;
Hongwei Kan, Jiangsu, CN;
Yaming Xu, Jiangsu, CN;
INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD., Jiangsu, CN;
Abstract
A method and apparatus for performing a power stress test on an FPGA acceleration card and a computer-readable storage medium. The method includes: dividing, according to a partial reconfiguration method, a hardware resource of an FPGA acceleration card into a static region serving as a hardware logic implementation region for performing a normal function test, and a dynamic PR region including a blank mode occupying no hardware resource and a power test mode for performing a power stress test, and burning FPGA firmware having a partial reconfiguration function to a flash memory; upon receiving a request for power stress test, configuring an operation mode of the dynamic PR region to be the power test mode, loading, to the dynamic PR region, a dynamic PR configuration file burned in the flash memory; and calling a power stress test module to execute the power stress test in the dynamic PR region.