The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Jun. 25, 2020
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Chinlin Chen, Santa Clara, CA (US);

Anu Mercian, Santa Clara, CA (US);

Renato Chaves de Aguiar, Santa Clara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 11/07 (2006.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01); H04L 41/0654 (2022.01); H04L 12/24 (2006.01); H04L 41/0813 (2022.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/0709 (2013.01); G06F 11/0751 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); H04L 41/0654 (2013.01);
Abstract

An event analysis system is provided. During operation, the system can determine an event description associated with the switch from an event log of the switch. The event description can correspond to an entry in a table in a switch configuration database of the switch. A respective database in the switch can be a relational database. The system can then obtain an event log segment, which is a portion of the event log, comprising the event description based on a range of entries. Subsequently, the system can apply a pattern recognition technique on the event log segment based on the entry in the switch configuration database to determine one or more patterns corresponding to an event associated with the event description. The switch can then apply a machine learning technique using the one or more patterns to determine a recovery action for mitigating the event.


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