The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Jun. 23, 2021
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Kenji Ito, Saitama, JP;
Toshio Sasaki, Saitama, JP;
Masayasu Konishi, Saitama, JP;
Michio Cho, Saitama, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 15/167 (2006.01); G02B 3/02 (2006.01); G02B 13/18 (2006.01); G02B 15/15 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 15/167 (2013.01); G02B 3/02 (2013.01); G02B 13/18 (2013.01); G02B 15/15 (2013.01); G02B 27/0025 (2013.01);
Abstract
A lenshas unevenness within an optical effective diameter D of an optical surface, an arithmetic mean roughness Ra within the optical effective diameter D of the optical surfaceis 20 nm or more and 50 nm or less, and an average value of widths W of protrusion portionsof the unevenness on an average line Cof a roughness curve Cof the optical surfaceis 1/200 or more and 1/50 or less of the optical effective diameter D of the optical surface. The lensis suitably used as a lens that composes a zoom lens or an imaging lens.