The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Feb. 14, 2022
Fujifilm Corporation, Tokyo, JP;
Akira Maruyama, Kanagawa, JP;
Keisuke Kodama, Kanagawa, JP;
Tetsuro Otsuka, Kanagawa, JP;
Hiroyuki Hagio, Kanagawa, JP;
Yuta Takahashi, Kanagawa, JP;
Shinpei Yoshida, Kanagawa, JP;
Satoshi Yanokuchi, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided is an optical film with a resin substrate adhered to an optically anisotropic layer and suppression of occurrence of optical defects in the optically anisotropic layer. The optical film has a resin substrate having an alignment regulating force and an optically anisotropic layer arranged thereon, in which the optically anisotropic layer contains a liquid crystal compound and a compound having a heteroatom different from the liquid crystal compound, and in a case where a surface of the optical film on an optically anisotropic layer side thereof is a first surface and a surface of the optical film on a resin substrate side thereof is a second surface, and components of the optical film in a depth direction are analyzed by time-of-flight secondary ion mass spectrometry while irradiating the optical film with an ion beam from the first surface toward the second surface, the obtained profile satisfies a predetermined requirement.