The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Feb. 16, 2022
Applicant:

Tanway Technology (Beijing) Co., Ltd., Beijing, CN;

Inventors:

Feifei Shi, Beijing, CN;

Shiwei Wang, Beijing, CN;

Ruitong Zheng, Beijing, CN;

Luofeng Shen, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/48 (2006.01); G01S 7/497 (2006.01); G01S 7/481 (2006.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4972 (2013.01); G01S 7/4802 (2013.01); G01S 7/4808 (2013.01); G01S 7/4816 (2013.01); G01S 17/89 (2013.01);
Abstract

A method and a system for optically adjusting an image fusion LiDAR system are provided. The method includes: presetting initial positions of a first detector and a second detector; acquiring signal strengths of the echo signals emitted by diffuse reflection at different positions on a background wall detected by the first detector; determining a first mark position on the background wall according to the signal strengths of the echo signals; and adjusting at least one of a position or an attitude of the second detector according to an echo signal emitted by diffuse reflection at the first mark position, the first detector and the second detector being each a linear array detector.


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