The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Oct. 07, 2019
Applicant:
Bayerische Motoren Werke Aktiengesellschaft, Munich, DE;
Inventor:
Dominik Kellner, Dachau, DE;
Assignee:
Bayerische Motorenwerke Aktiengesellschaft, Munich, DE;
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G01S 7/41 (2006.01); G06V 20/58 (2022.01); G01S 13/931 (2020.01);
U.S. Cl.
CPC ...
G01S 7/411 (2013.01); G06V 20/58 (2022.01); G01S 13/931 (2013.01); G01S 2013/9323 (2020.01); G01S 2013/9324 (2020.01);
Abstract
A concept of characterizing an object based on measurement samples from one or more location sensors, the measurement samples having a first spatial resolution. The measurement samples are quantized to a grid map of weighted cells having a second spatial resolution lower than the first spatial resolution, wherein a measurement sample contributes to a weight coefficient of one or more weighted cells depending on a measurement accuracy. Parameters of one or more lines fitting the weighted cells are computed to obtain a characterization of the object.