The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Nov. 10, 2020
Abb Schweiz Ag, Baden, CH;
Frank Kassubek, Rheinfelden, DE;
Miklos Lenner, Daettwil, CH;
Stefano Marano, Zurich, CH;
Gerrit Held, Oberrohrdorf, CH;
ABB Schweiz AG, Baden, CH;
Abstract
A measurement system for measuring an inhomogeneity of a medium in a vessel includes: a first ultrasound emitter for sending a first ultrasound signal along a first path; a second ultrasound emitter for sending a second ultrasound signal along a second path different from the first path; a first ultrasound receiver for receiving the first ultrasound signal and measuring a first measurement parameter pof the received first ultrasound signal; a second ultrasound receiver for receiving the second ultrasound signal and measuring a second measurement parameter pof the received second ultrasound signal; and a control unit: receives the first measurement parameter pfrom the first ultrasound receiver, receives the second measurement parameter pfrom the second ultrasound receiver, and determines a ratio p/pof the first measurement parameter pto the second measurement parameter p