The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Mar. 11, 2022
Nec Corporation, Tokyo, JP;
Naoya Nakayama, Tokyo, JP;
Masanori Sekido, Tokyo, JP;
Shinichi Morimoto, Tokyo, JP;
Masayuki Ariyoshi, Tokyo, JP;
Tatsuya Sumiya, Tokyo, JP;
Toshiyuki Nomura, Tokyo, JP;
Toshinori Takemura, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
To shorten a waiting time for a belongings inspection, the present invention provides an inspection systemincluding: an electromagnetic wave transmission/reception unitthat irradiates an electromagnetic wave having a wavelength of equal to or more than 30 micrometers and equal to or less than one meter, and receives a reflection wave; a detection unitthat performs detection processing of detecting an abnormal state, based on a signal of the reflection wave; a decision unitthat decides, for an inspection target person from which the abnormal state is detected, whether to perform a secondary inspection at a place or perform a secondary inspection later; and a registration unitthat registers, in association with a result of the detection processing, identification information about the inspection target person decided that a secondary inspection is performed later.