The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Jan. 25, 2022
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Hongki Yoo, Daejeon, KR;

Wooseop Kim, Daejeon, KR;

Juehyung Kang, Daejeon, KR;

Ungyo Kang, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 21/00 (2006.01); G02B 21/04 (2006.01); G02B 21/16 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G01N 21/6428 (2013.01); G02B 21/002 (2013.01); G02B 21/04 (2013.01); G02B 21/16 (2013.01);
Abstract

The multi-photon microscope comprises a repetition rate tuner that lowers an optical pulse train emitted from a pulsed laser to a repetition rate for time-gated detection, a scanner that scans the optical pulse train transmitted from the repetition rate tuner in x-axis and y-axis directions, an objective lens that irradiates an optical signal scanned by the scanner to the sample and acquires a fluorescence signal emitted from the excited fluorescent material, a photodetector that photoelectrically converts the fluorescence signal acquired by the objective lens, an amplifier that converts a current signal output from the photodetector into a voltage signal, a digitizer that samples the voltage signal output from the amplifier, and a computing device that separates sampling data output from the digitizer with a detection window set in time domain, and generates an image based on the sampling data separated by the detection window.


Find Patent Forward Citations

Quick Actions:

Yoo, Hongki. (2024). Multi-photon microscopy and imaging method, lowering repetition rate to use time-gated detection (U.S. Patent No. 11860101). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11860101

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…