The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Jan. 31, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yuma Matsuda, Tokyo, JP;

Akihiro Tanaka, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G01N 21/39 (2013.01); G01N 2201/126 (2013.01);
Abstract

A detection unit receives an optical signal that has passed through a space to be measured. A spectrum extraction unit extracts a range to be measured from the optical signal received by the detection unit. The spectrum extraction unit extracts an optical signal formed as a gas molecule of a gas to be measured absorbs energy of the optical signal. A determination unit determines the presence of an anomaly in the space to be measured based on a waveform of the optical signal extracted by the spectrum extraction unit.


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