The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Apr. 02, 2022
Applicant:

The Board of Trustees of the University of Illinois, Urbana, IL (US);

Inventors:

Rohit Bhargava, Champaign, IL (US);

Seth M Kenkel, Urbana, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3563 (2014.01); G01Q 60/24 (2010.01); G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3563 (2013.01); G01Q 60/24 (2013.01); G01N 21/39 (2013.01); G01N 2201/06113 (2013.01);
Abstract

A method for nanoscale tomographic infrared absorption imaging is provided, the method including: generating a first plurality of sets of probe measurements for a plurality of sample locations located across a surface of a sample, and measuring a magnitude and phase of a variation in displacement of the surface of the sample at the particular sample location at the second frequency, wherein the first frequency and the second frequency differ; and generating, based on the first plurality of sets of probe measurements, a three-dimensional tomographic map of absorption of infrared light at the first wavelength by the sample. Generating measurements for a particular location includes generating a first probe measurement by illuminating the sample with infrared light that varies at a first frequency and measuring a variation in displacement of the surface of the sample at the particular sample location at the first frequency.


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