The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Dec. 07, 2018
Applicant:
Kemira Oyj, Helsinki, FI;
Inventors:
Assignee:
Kemira Oyj, Helsinki, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D21H 21/36 (2006.01); D21B 1/34 (2006.01); D21C 9/00 (2006.01); D21D 5/28 (2006.01); D21G 9/00 (2006.01); D21H 21/02 (2006.01); G01N 33/34 (2006.01); D21B 1/32 (2006.01);
U.S. Cl.
CPC ...
D21H 21/36 (2013.01); D21B 1/32 (2013.01); D21B 1/345 (2013.01); D21C 9/008 (2013.01); D21D 5/28 (2013.01); D21G 9/0018 (2013.01); D21H 21/02 (2013.01); G01N 33/343 (2013.01);
Abstract
A method is disclosed for predicting the microbial status of a paper or board making process and/or quality of the dry board or paper obtained from the process for controlling microbial status of a paper or board making process or quality of the dry board or paper obtained from the process. Surface level and duration of time in at least one storage tower or pulper are monitored and correlated with respective predetermined values for the tower or pulper in order to predict the risk of microbial activity.