The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Feb. 21, 2023
Applicant:

Sigma Additive Solutions, Inc., Santa Fe, NM (US);

Inventors:

Vivek R. Dave, Concord, NH (US);

R. Bruce Madigan, Butte, MT (US);

Mark J. Cola, Santa Fe, NM (US);

Martin S. Piltch, Los Alamos, NM (US);

Assignee:

Sigma Additive Solutions, Inc., Santa Fe, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29C 64/153 (2017.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B22F 10/28 (2021.01); B22F 12/44 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B22F 10/31 (2021.01); B22F 10/38 (2021.01); B33Y 40/00 (2020.01); B29C 64/393 (2017.01); B22F 3/24 (2006.01); B22F 10/12 (2021.01); B22F 10/18 (2021.01); B22F 10/25 (2021.01); B22F 10/368 (2021.01);
U.S. Cl.
CPC ...
B29C 64/153 (2017.08); B22F 10/28 (2021.01); B22F 10/31 (2021.01); B22F 10/38 (2021.01); B22F 12/44 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B29C 64/393 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 40/00 (2014.12); B33Y 50/02 (2014.12); B22F 10/12 (2021.01); B22F 10/18 (2021.01); B22F 10/25 (2021.01); B22F 10/368 (2021.01); B22F 2003/245 (2013.01); Y02P 10/25 (2015.11);
Abstract

This invention teaches a quality assurance system for additive manufacturing. This invention teaches a multi-sensor, real-time quality system including sensors, affiliated hardware, and data processing algorithms that are Lagrangian-Eulerian with respect to the reference frames of its associated input measurements. The quality system for Additive Manufacturing is capable of measuring true in-process state variables associated with an additive manufacturing process, i.e., those in-process variables that define a feasible process space within which the process is deemed nominal. The in-process state variables can also be correlated to the part structure or microstructure and can then be useful in identifying particular locations within the part likely to include defects.


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