The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Dec. 21, 2020
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Hoon Sohn, Daejeon, KR;
Peipei Liu, Daejeon, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Abstract
Disclosed are a method of inspecting a printing quality of a 3D printing object using a femtosecond laser beam during a 3D printing process, and an apparatus and a 3D printing system for the same. A laser beam is irradiated from a femtosecond laser source disposed coaxially with a 3D printing laser source to inspect a state of the printing object. The laser beam generated by the femtosecond laser source is separated into a pump laser beam and a probe laser beam. The printing laser beam irradiated from a 3D printing laser source or the pump laser beam is irradiated onto a printing object to generate ultrasonic waves. To measure the ultrasonic waves, a probe laser beam is irradiated onto the printing object. The probe laser beam reflected by the printing object is detected. The quality of the printing object is inspected by analyzing the reflected probe laser beam.