The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Mar. 05, 2020
Primetals Technologies Austria Gmbh, Linz, AT;
Primetals Technologies Germany Gmbh, Erlangen, DE;
Martin Kerschensteiner, Berg, DE;
Daniel Kotzian, Forchheim, DE;
Matthias Kurz, Erlangen, DE;
Klaus Loehe, Fürth, DE;
Andreas Maierhofer, Marloffstein, DE;
Daniel Ott, Linz, AT;
Mirko Tunk, Heroldsbach, DE;
Abstract
A control device () for a roll stand (). During rolling of a metal strip () in the roll stand (), the device receives measurement data (M) for a lateral position (y) of the metal strip () on the inlet side and/or outlet side of the roll stand (). Taking into account parameters (P) of the stand regulator () on the basis of the deviation in the lateral position (y) from a target position (y*), a stand regulator () of the control device () determines a tilt value (δs) for the roll stand () and controls the roll stand () accordingly. The control device () determines at least one variable (V, V, Q, Q) from which it is derived, for both strip edges () of the metal strip (), whether the metal strip () forms an undulation () in the region of the particular strip edge (). As soon as the metal strip () forms an undulation () in the region of one of the strip edges (), the control device () varies at least one of the parameters (P) of the stand regulator (), such that the stand regulator () determines the tilt value (δs), starting from the variation in the at least one parameter (P), and taking into account the changed parameter (P).