The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Oct. 26, 2020
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Masanao Miyawaki, Yamanashi, JP;

Assignee:

Fanuc Corporation, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B08B 3/02 (2006.01); B08B 13/00 (2006.01); G06T 7/00 (2017.01); B08B 5/02 (2006.01); G06V 10/50 (2022.01); G06V 10/56 (2022.01); G06V 20/10 (2022.01);
U.S. Cl.
CPC ...
B08B 13/00 (2013.01); B08B 3/02 (2013.01); B08B 5/02 (2013.01); G06T 7/001 (2013.01); G06V 10/50 (2022.01); G06V 10/56 (2022.01); G06V 20/10 (2022.01); G06T 2207/30164 (2013.01);
Abstract

A device capable of determining whether or not to clean a work area of a machine tool with higher accuracy. The device includes an imaging device configured to capture first image data of the work area before machining, and configured to capture second image data of the work area after machining, an image data generation section configured to generate third image data indicating a degree of change between brightness of a pixel of the first image data and brightness of a pixel of the second image data, and a determination section configured to determine whether or not to clean the work area based on a histogram indicating a relationship between the brightness of the pixel of the third image data and the number of pixels of the third image data.


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