The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Apr. 13, 2020
Applicant:

Satake Corporation, Tokyo, JP;

Inventors:

Takafumi Ito, Tokyo, JP;

Tadashi Matsushita, Tokyo, JP;

Masaaki Sadamaru, Tokyo, JP;

Assignee:

SATAKE CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07C 5/342 (2006.01); B07C 5/36 (2006.01);
U.S. Cl.
CPC ...
B07C 5/3425 (2013.01); B07C 5/361 (2013.01);
Abstract

To provide an optical grain sorter that can reduce the proportion of non-defective grains blown off collaterally, and even in a case in which a plurality of defective grains or the like fall down in a state overlapping each other, can blow off all the defective grains or the like. The optical granular matter sorter includes a control unit configured to control an ejection time of a compressed gas from an air ejecting unit based on a result of detection obtained by an optical detecting unit, in which the control unit has a comparing unit configured to compare a defect detection time for an object to be sorted by the optical detecting unit and a single-granular matter passage set time set in advance, and a calculating unit configured to multiply the defect detection time by a predetermined coefficient based on a result of comparison obtained by the comparing unit to calculate the ejection time, and in a case in which the defect detection time is less than or equal to the single-granular matter passage set time as the result of comparison obtained by the comparing unit, the calculating unit multiplies the defect detection time by a small coefficient as compared to a case in which the defect detection time exceeds the single-granular matter passage set time to calculate the ejection time, and controls the ejection time of the compressed gas from the air ejecting unit based on a result of calculation.


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