The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Dec. 21, 2018
Icst Corporation, Saitama, JP;
Yasunori Kato, Saitama, JP;
Abstract
A test device and a test method are provided which can prevent a specimen liquid from splattering and leaking and perform an examination simply and safely. The test device includes a culturing unit configured to be capable of culturing a specimen in a sealed state, a test piece configured to be capable of absorbing a specimen liquid in the culturing unit, a separating unit configured to be capable of separating the test piece and the specimen liquid in a non-contact state, an opening unit configured to be capable of opening at least a portion of the separating unit to form a flow path through which the specimen liquid reaches the test piece, and a case configured to integrally seal at least a portion of the test piece on a side closer to the separating unit, at least a portion of the culturing unit, and the separating unit.