The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Jun. 21, 2021
Applicant:
Litepoint Corporation, San Jose, CA (US);
Inventors:
Chen Cao, Sunnyvale, CA (US);
Christian Volf Olgaard, Saratoga, CA (US);
Ray Wang, Santa Clara, CA (US);
Assignee:
LITEPOINT CORPORATION, San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
H04B 17/0085 (2013.01); G01R 31/2822 (2013.01);
Abstract
System and method for measuring path loss of a conductive radio frequency (RF) signal path used in testing a RF data signal transceiver device under test (DUT) with a RF vector signal transceiver. A path loss measurement may be performed by initially leaving an open connection at the RF signal path end normally connected to the DUT during DUT testing. Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies avoids need for additional testing with shorted and loaded connections at the RF signal path end.