The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Apr. 23, 2021
Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Mark L. Oskotsky, Mamaroneck, NY (US);
Thomas Altamura, Hicksville, NY (US);
Daniel Engheben, Commack, NY (US);
Morgan Jolley, Commack, NY (US);
Christopher V. Lipari, Whitestone, NY (US);
Vincent Lipari, Whitestone, NY (US);
Jerry Ma, Flushing, NY (US);
Michael J. Russo, Jr., Roslyn, NY (US);
Yueli Zhang, Saint James, NY (US);
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Abstract
A Mid-Wave Infrared (MWIR) objective lens having an F # of 2.64 and a 33.6° angular field of view. It is deployed, with a focal plane and scanning system, on an airborne platform for remote sensing applications. Focal length is 9 inches, and the image is formed on a focal plane constituting CCD or CMOS with micro lenses. The lens has, from object to image, three optical element groups with a cold shield/aperture stop. Group 1 has a positive optical power and three optical elements; Group 2 has a positive optical power and four optical elements; Group 3 has a positive optical power and three optical elements. The objective lens is made of two Germanium and Silicon. The lens is both apochromatic and orthoscopic, and corrected for monochromatic and chromatic aberrations over 3.3 to 5.1 micrometers.