The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Oct. 14, 2022
Applicant:

Borries Pte. Ltd., Singapore, SG;

Inventors:

Wei Fang, Saratoga, CA (US);

Xiaoming Chen, Sunnyvale, CA (US);

Daniel Tang, Fremont, CA (US);

Liang-Fu Fan, Fremont, CA (US);

Zhongwei Chen, Los Altos Hills, CA (US);

Assignee:

BORRIES PTE. LTD., Singapore, SG;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/244 (2006.01); G01N 23/203 (2006.01);
U.S. Cl.
CPC ...
H01J 37/244 (2013.01); G01N 23/203 (2013.01); G01N 2223/053 (2013.01); G01N 2223/3302 (2013.01); G01N 2223/418 (2013.01); G01N 2223/646 (2013.01); H01J 2237/24475 (2013.01);
Abstract

The present invention provides a backscattered electron (BSE) detector comprising two or more detection components that are electrically isolated from each other. Each of the detection components includes a single continuous top metal layer configured for directly receiving incident backscattered electrons and for backscattered electron to penetrate therethrough. The thickness of one of the top metal layers is different from the thickness of another one of the top metal layers. The BSE detector can be used in an apparatus of charged-particle beam for imaging a sample material. Signals from the detection components having top metal layers of different thicknesses can be inputted into different signal amplifier circuits to get different energy bands of BSE image.


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