The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Nov. 22, 2021
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Fan Zhang, Fremont, CA (US);

Aman Bhatia, Los Gatos, CA (US);

Haobo Wang, San Jose, CA (US);

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/26 (2006.01); G11C 16/34 (2006.01); G11C 16/10 (2006.01); G06N 3/063 (2023.01); G11C 16/14 (2006.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G11C 16/3404 (2013.01); G06F 18/214 (2023.01); G06N 3/063 (2013.01); G11C 16/102 (2013.01); G11C 16/14 (2013.01); G11C 16/26 (2013.01);
Abstract

A scheme for non-parametric optimal read threshold estimation of a memory system. The memory system includes a memory device including pages and a controller including a neural network. The controller performs read operations on a selected page using a read threshold set; obtain the read threshold set, a checksum value and an asymmetric ratio of ones count and zeros count which are associated with decoding of the selected page according to each of the read operations; provide the obtained read threshold set, the checksum value and the asymmetric ratio as input information to the neural network; and estimate, by the neural network, an optimal read threshold voltage based on the input information and weights including a combination of multiple matrices and bias vectors.


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