The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Mar. 22, 2022
Hrl Laboratories, Llc, Malibu, CA (US);
Hyukseong Kwon, Thousand Oaks, CA (US);
Amit Agarwal, San Francisco, CA (US);
Amir M. Rahimi, Santa Monica, CA (US);
Kevin Lee, Irvine, CA (US);
Alexie Pogue, Los Angeles, CA (US);
Rajan Bhattacharyya, Sherman Oaks, CA (US);
HRL LABORATORIES, LLC, Malibu, CA (US);
Abstract
Described is a system for evaluating and correcting perception errors in object detection and recognition. The system receives perception data from an environment proximate a mobile platform. Perception probes are generated from the perception data which describe perception characteristics of object detections in the perception data. For each perception probe, probabilistic distributions for true positive and false positive values are determined, resulting in true positive and false negative perception probes. Statistical characteristics of true positive perception probes and false positive perception probes are then determined. Based on the statistical characteristics, true positive perception probes are clustered. An axiom is generated to determine statistical constraints for perception validity for each perception probe cluster. The axiom is evaluated to classify the perception probes as valid or erroneous. Optimal perception parameters are generated by solving an optimization problem based on the axiom. The perception module is adjusted based on the optimal perception parameters.