The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Nov. 29, 2018
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yuta Kudo, Tokyo, JP;

Rui Ishiyama, Tokyo, JP;

Toru Takahashi, Tokyo, JP;

Kengo Makino, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/49 (2017.01); G06T 7/33 (2017.01); G06V 10/40 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/337 (2017.01); G06T 7/49 (2017.01); G06V 10/40 (2022.01);
Abstract

An individual identification apparatus that identifies an individual product having a pattern of irregularities randomly formed on a surface thereof includes an imaging unit and an extracting unit. The imaging unit is configured to acquire an image obtained by capturing a date mark formed on the product. The extracting unit is configured to extract a feature value related to the pattern of the irregularities from the image as data identifying the individual product.


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