The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Aug. 25, 2021
Applicant:
Unitx, Inc., San Jose, CA (US);
Inventor:
Kedao Wang, San Jose, CA (US);
Assignee:
UNITX, Inc., San Jose, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/62 (2017.01); G06T 7/73 (2017.01); G06V 10/22 (2022.01); G06V 10/82 (2022.01); G06T 3/40 (2006.01); B25J 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0006 (2013.01); B25J 11/00 (2013.01); G06T 3/40 (2013.01); G06T 7/62 (2017.01); G06T 7/73 (2017.01); G06V 10/22 (2022.01); G06V 10/82 (2022.01); G06T 2207/20084 (2013.01); G06T 2207/30108 (2013.01); G06T 2207/30164 (2013.01); G06V 2201/06 (2022.01);
Abstract
The present disclosure provides a dimensional measurement method and device based on deep learning. The method includes capturing a target image of a target object, obtaining measurement data for the target image, and determining whether or not the target object is within a preset tolerance.