The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Jun. 28, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Dinesh Kumar Yadav, Bangalore, IN;

Ankur Deshwal, Bangalore, IN;

Saptarsi Das, Bangalore, IN;

Junwoo Jang, Suwon-si, KR;

Sehwan Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/20 (2006.01); G06N 3/08 (2023.01); G06F 18/2111 (2023.01); G06T 1/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/20 (2013.01); G06F 18/2111 (2023.01); G06N 3/08 (2013.01); G06T 1/0007 (2013.01);
Abstract

A method of performing convolution in a neural network with variable dilation rate is provided. The method includes receiving a size of a first kernel and a dilation rate, determining at least one of size of one or more disintegrated kernels based on the size of the first kernel, a baseline architecture of a memory and the dilation rate, determining an address of one or more blocks of an input image based on the dilation rate, and one or more parameters associated with a size of the input image and the memory. Thereafter, the one or more blocks of the input image and the one or more disintegrated kernels are fetched from the memory, and an output image is obtained based on convolution of each of the one or more disintegrated kernels and the one or more blocks of the input image.


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