The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Mar. 15, 2021
Siemens Healthcare Gmbh, Erlangen, DE;
Christian Hofmann, Erlangen, DE;
Matthias Baer-Beck, Spardorf, DE;
SIEMENS HEALTHCARE GMBH, Erlangen, DE;
Abstract
A method is for providing a second artifact-reduced x-ray image dataset based on an artifact-affected x-ray image dataset of an examination object, the artifact being caused by an object at least one of on, outside of and within the examination object. In an embodiment, the method includes creating a first artifact-reduced x-ray image dataset based on the artifact-affected x-ray image dataset, based on which a second projection dataset is created; identifying an object area which maps the object in the at least one projection; creating a third projection dataset based on the first projection dataset; and crating the second artifact-reduced x-ray image dataset based on the third projection dataset, through which the second artifact-reduced x-ray image dataset is provided.