The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Jul. 23, 2021
Accuray, Inc., Sunnyvale, CA (US);
Chuanyong Bai, Solon, OH (US);
Robert Zahn, Chagrin Falls, OH (US);
Daniel Gagnon, Twinsburg, OH (US);
Amit Jain, Solon, OH (US);
Zhicong Yu, Highland Hts., OH (US);
Georgios Prekas, Solon, OH (US);
Accuray, Inc., Sunnyvale, CA (US);
Abstract
Disclosed herein is an imaging system including a first x-ray source configured to produce first x-ray photons in a first energy range suitable for imaging, project the first x-ray photons onto an area designated for imaging, a rotatable gantry configured to rotate the first x-ray source such that the first x-ray source traverses an angular path, and a data processor having an analytical portion. The analytical portion is configured to collect first data relating to the transmission of the first x-ray photons through the area designated for imaging at a set of image-collection angles along the angular path, collect background data at a set of background-collection angles along the angular path, wherein the system acquires more than one image of the designated area for imaging between background angles. The analytical portion is also configured to remove errors in the first data using the background data, and generate a corrected image based on the removal of errors in the first data.