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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11854113 B1

PDFFull Text
Date of Patent:
Dec. 26, 2023

Filed:

Nov. 03, 2020

Deep learning methods for event verification and image re-purposing detection

Applicant:

Mayachitra, Inc., Santa Barbara, CA (US);

Inventors:

Lakshmanan Nataraj, Goleta, CA (US);

Michael Gene Goebel, Santa Barbara, CA (US);

Bangalore S. Manjunath, Santa Barbara, CA (US);

Shivkumar Chandrasekaran, Santa Barbara, CA (US);

Assignee:

Mayachitra, Inc., Santa Barbara, CA (US);

Attorney:

Schwegman Lundberg & Woessner, P.A.

Primary Examiner:

Dhaval V Patel

Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 1/00 (2006.01); G06F 16/55 (2019.01); G06T 3/40 (2006.01); G06N 3/04 (2023.01); G06N 3/08 (2023.01); G06F 18/2415 (2023.01); G06F 18/22 (2023.01); G06F 18/213 (2023.01); G06F 18/2431 (2023.01); G06V 30/24 (2022.01); G06V 10/764 (2022.01); G06V 20/00 (2022.01); G06V 20/40 (2022.01);
U.S. Cl.
CPC ...
G06T 1/0028 (2013.01); G06F 16/55 (2019.01); G06F 18/213 (2023.01); G06F 18/22 (2023.01); G06F 18/2415 (2023.01); G06F 18/2431 (2023.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06T 3/40 (2013.01); G06V 10/764 (2022.01); G06V 20/35 (2022.01); G06V 30/248 (2022.01); G06V 20/44 (2022.01);
Abstract

Systems and methods herein describe accessing an image, generating a resized image, generating an image feature vector by applying an image classification neural network to the resized image, generating analysis of the image by processing the image feature vector using a machine-learning classifier trained to analyze the image feature vector, and based on the analysis, determining an event that is attributed to the image.

Find Patent Forward Citations

Nataraj, Lakshmanan. (2023). Deep learning methods for event verification and image re-purposing detection (U.S. Patent No. 11854113). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11854113

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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