The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Aug. 09, 2021
Applicant:

Ebay Inc., San Jose, CA (US);

Inventors:

Tomer Lancewicki, Jersey City, NJ (US);

Ramesh Periyathambi, San Ramon, CA (US);

Assignee:

EBAY INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/0283 (2023.01); G06N 20/00 (2019.01); G06Q 30/0601 (2023.01); G06Q 30/0201 (2023.01);
U.S. Cl.
CPC ...
G06Q 30/0283 (2013.01); G06N 20/00 (2019.01); G06Q 30/0206 (2013.01); G06Q 30/0619 (2013.01);
Abstract

A method of training a machine learning model to determine an item margin is provided. The method includes monitoring a first value for a first item having attributes and monitoring a first value for a second type of item having attributes where an attribute of the first attributes is the same as an attribute of the second attributes. The method also includes determining a first margin based on the first values. The first attributes, the second attributes, and the first margin are input as training data for the machine learning model where the machine learning model is trained with the training data. The monitoring operations for the first item and the second item are repeated to obtain a second value for the first and second items. Furthermore, the trained machine learning model is applied to the second values to determine a second margin.


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