The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Jan. 20, 2021
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

Wenbing Huang, Shenzhen, CN;

Yu Rong, Shenzhen, CN;

Junzhou Huang, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/213 (2023.01); G06N 3/08 (2023.01); G06F 18/214 (2023.01); G06F 18/2413 (2023.01); G06N 7/01 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 18/213 (2023.01); G06F 18/214 (2023.01); G06F 18/24147 (2023.01); G06N 7/01 (2023.01);
Abstract

The present disclosure describes methods, apparatus, and storage medium for node classification and training a node classification model. The method includes obtaining a target node subset and a neighbor node subset corresponding to the target node subset from a sample node set labeled with a target node class, a neighbor node in the neighbor node subset being associated with a target node in the target node subset; extracting a feature subset of the target node subset based on the neighbor node subset by using a node classification model, the feature subset comprising a feature vector of the target node; performing class prediction for the target node subset according to the feature subset, to obtain a predicted class probability subset; and training the node classification model with a target model parameter according to the predicted class probability subset and a target node class subset of the target node subset.


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