The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

May. 24, 2019
Applicant:

Nvoq Incorporated, Boulder, CO (US);

Inventors:

Charles N. Corfield, Boulder, CO (US);

Stephen L. Bulick, Boulder, CO (US);

E. Peter Fox, Boulder, CO (US);

Adam M. Ornstein, Boulder, CO (US);

Derek C. Smith, Boulder, CO (US);

Assignee:

nVoq Incorporated, Boulder, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/166 (2020.01); G06F 40/174 (2020.01); G06F 3/0482 (2013.01); G06V 30/148 (2022.01);
U.S. Cl.
CPC ...
G06F 40/166 (2020.01); G06F 3/0482 (2013.01); G06F 40/174 (2020.01); G06V 30/153 (2022.01);
Abstract

A digital display of an active window is provided. An application, separate from the application providing the digital display, is capable of identifying an artifact in the active window of the digital display without a priori knowledge or an application programming interface to the application providing the digital display. The artifacts may be alpha-numeric artifacts or non-alpha-numeric artifacts. The active window may be examined in multiple dimensions including 2 dimensions, 3 dimensions or more. Alpha-numeric artifacts, once identified, are pre-processed to remove anti-aliasing to allow for processor optical recognition.


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