The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Jan. 24, 2023
Applicant:

Netapp, Inc., San Jose, CA (US);

Inventors:

Krishna Murthy Chandraiah Setty Narasingarayanapeta, Bangalore, IN;

Preetham Shenoy, Bangalore, IN;

Divya Kathiresan, Bangalore, IN;

Rakesh Bhargava, Karnataka, IN;

Assignee:

NetApp, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/065 (2013.01); G06F 3/067 (2013.01); G06F 3/0613 (2013.01); G06F 3/0619 (2013.01); G06F 3/0631 (2013.01); G06F 3/0653 (2013.01); G06F 3/0659 (2013.01);
Abstract

Systems and methods are described for performing persistent inflight tracking of operations (Ops) within a cross-site storage solution. According to one embodiment, a method comprises maintaining state information regarding a data synchronous replication status for a first storage object of a primary storage cluster and a second storage object of a secondary storage cluster. The method includes performing persistent inflight tracking of I/O operations with a first Op log of the primary storage cluster and a second Op log of the secondary storage cluster, establishing and comparing Op ranges for the first and second Op logs, and determining a relation between the Op range of the first Op log and the Op range of the second Op log to prevent divergence of Ops in the first and second Op logs and to support parallel split of the Ops.


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