The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Mar. 20, 2023
Bottomline Technologies, Inc., Portsmouth, NH (US);
Paul Green, Londonderry, NH (US);
Jerzy Bala, Potomac Falls, VA (US);
Bottomline Technologies, Inc., Portsmouth, NH (US);
Abstract
A novel distributed method for machine learning is described, where the algorithm operates on a plurality of data silos, such that the privacy of the data in each silo is maintained. In some embodiments, the attributes of the data and the features themselves are kept private within the data silos. The method includes a distributed learning algorithm whereby a plurality of data spaces are co-populated with artificial, evenly distributed data, and then the data spaces are carved into smaller portions whereupon the number of real and artificial data points are compared. Through an iterative process, clusters having less than evenly distributed real data are discarded. A plurality of final quality control measurements are used to merge clusters that are too similar to be meaningful. These distributed quality control measures are then combined from each of the data silos to derive an overall quality control metric.