The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Sep. 05, 2019
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Ramesh Natarajan, Pleasantville, NY (US);

Kamalakannan Elangovan, Jersey City, NJ (US);

Sravan Kumar Kasturi, Snohomish, WA (US);

James Kingsbery, Westfield, NJ (US);

Assignee:

AMAZON TECHNOLOGIES, INC., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06F 17/15 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G06F 17/156 (2013.01);
Abstract

Devices and techniques are generally described for determining a recalibration frequency of a state space model. In various examples, a first hyperparameter for a first dataset may be determined. A residual value between a first data point of the first dataset and a machine learning model fitted to the first dataset may be determined. A plurality of second datasets may be generated based on the residual value. Second hyperparameters may be determined for the plurality of second datasets. A variability of the second hyperparameters may be determined. A third hyperparameter may be determined for a subset of the first dataset. A recalibration frequency may be determined for the machine learning model by comparing the third hyperparameter to the variability of the second hyperparameters.


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