The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Feb. 11, 2022
Applicant:

Soochow University, Suzhou, CN;

Inventors:

Yahong Chen, Suzhou, CN;

Chencheng Yan, Suzhou, CN;

Fei Wang, Suzhou, CN;

Yangjian Cai, Suzhou, CN;

Assignee:

SOOCHOW UNIVERSITY, Suzhou, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/16 (2006.01);
U.S. Cl.
CPC ...
G06F 17/16 (2013.01);
Abstract

The invention relates to a method for rapidly calculating a three-dimensional polarimetric dimension, including: determining that an incident light field is a coherence matrix of a partially coherent Schell-model beam, and decomposing the coherence matrix into a form of multiplying an incident electric field by a coherence structure matrix of the incident light field; obtaining an electric field near a focal field after the incident electric field passes through a tight focusing system according to the vector diffraction theory, and describing a second-order correlation characteristic of a partially coherent vector beam near a tightly focused field by using a coherence matrix; obtaining a tightly focused polarization matrix based on the tightly focused coherence matrix; and rotating the tightly focused polarization matrix into an intrinsic coordinate frame of the tightly focused polarization matrix, and calculating a three-dimensional polarimetric dimension of the partially coherent Schell-model beam in the tightly focused field.


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