The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Aug. 25, 2021
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Adam Oliner, San Francisco, CA (US);

Eric Sammer, San Francisco, CA (US);

Kristal Curtis, San Francisco, CA (US);

Nghi Nguyen, Union City, CA (US);

Assignee:

Splunk Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2455 (2019.01); G06F 40/205 (2020.01); G06F 16/248 (2019.01); G06N 5/04 (2023.01);
U.S. Cl.
CPC ...
G06F 16/24568 (2019.01); G06F 16/248 (2019.01); G06F 16/24564 (2019.01); G06F 40/205 (2020.01); G06N 5/04 (2013.01);
Abstract

As described herein, a portion of machine data of a message may be analyzed to infer, using an inference model, a sourcetype of the message. The portion of machine data may be generated by one or more components in an information technology environment. Based on the inference, a set of extraction rules associated with the sourcetype may be selected. Each extraction rule may define criteria for identifying a sub-portion of text from the portion of machine data of the message to produce a value. The set of extraction rules may be applied to the portion of machine data of the message to produce a result set that indicates a number of values identified using the set of extraction rules. Based on the result set, at least one action may be performed on one or more of inference data associated with the inference model and one or more messages.


Find Patent Forward Citations

Loading…