The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Oct. 28, 2022
Applicant:

Rubrik, Inc., Palo Alto, CA (US);

Inventors:

Jeffrey Hughes, Seattle, WA (US);

Daniel Hefenbrock, Palo Alto, CA (US);

Triantaphyllos Rakitzis, Seattle, WA (US);

Assignee:

Rubrik, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/14 (2019.01); G06F 16/11 (2019.01); G06F 16/13 (2019.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/122 (2019.01); G06F 16/134 (2019.01); G06F 16/156 (2019.01); G06F 16/2237 (2019.01);
Abstract

Embodiments are directed to managing file systems over a network. A hierarchical index may be provided based on a file system and a plurality of objects stored in the file system A token index may be generated based on the hierarchical index. Each token may be a portion of the path of the objects Metric indices may be generated based on the hierarchical index and a plurality of metrics associated with the objects such that the metrics indices include one or more rows that corresponds to a place position for a metric value. Employing the token index and the metric indices to generate query results based on the plurality of metrics associated with the objects.


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