The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

May. 30, 2022
Applicant:

Benq Corporation, Taipei, TW;

Inventors:

Chin-Fu Chiang, New Taipei, TW;

Tung-Chia Chou, New Taipei, TW;

Chang-Sheng Lee, Taipei, TW;

Assignee:

BenQ Corporation, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 21/14 (2006.01); G03B 21/20 (2006.01);
U.S. Cl.
CPC ...
G03B 21/147 (2013.01); G03B 21/142 (2013.01); G03B 21/2006 (2013.01);
Abstract

A projection device, a projection system and a method for calibrating projected image are provided. The projection device and an external projection device the same image source and respectively project an image and another image corresponding to the image source. The same portion of the image source where the two images overlap each other forms an overlapping area. The projection device includes a lens, a light shielding member and a processor. The light shielding member is disposed on the lens. The processor controls the light shielding member to selectively shade a partial area of the lens according to the brightness of the image source, wherein the partial area corresponds to the overlapping area.


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