The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Sep. 24, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Sangho Yoon, Suwon-si, KR;

Jongchul Choi, Suwon-si, KR;

Jaewoo Ko, Suwon-si, KR;

Bonkon Koo, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/00 (2006.01); G01S 17/894 (2020.01); G01B 11/25 (2006.01); G06T 19/00 (2011.01); G02B 27/01 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0172 (2013.01); G01B 11/25 (2013.01); G01S 17/894 (2020.01); G06T 19/006 (2013.01); G06T 2207/10028 (2013.01);
Abstract

A method, by an augmented reality device, of measuring a depth of an object includes determining, from a dot-pattern and a surface-pattern, a pattern of light to be emitted for measuring the depth of the object, identifying, from within an entire area of a pattern generator, a partial area of a light source unit corresponding to an area for the determined pattern, emitting light through the area for the determined pattern, by activating the identified partial area of the light source unit, receiving light reflected from the object; and measuring the depth of the object based on the emitted light and the received reflected light.


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